Husam M. Hassan & Ajaykumar S. Chinthalapndi BTH-AMT-EX--2005/D-12--SE, pp. 66. TEK/avd. för maskinteknik, 2005.
Cost effective and reliable damage detection is critical for the utilization of thin layered materials and microstructures. This Thesis presents a brief overview of conventional NDT methods and the usage of unconventional NDT methods applicable to thin layered materials, and the conclusion of applicability of these methods for damage detection in thin layered materials.